SEM with EDX – SUPRA 35 VP (Carl Zeiss) with Inca 400 (Oxford Instruments)

The scanning electron microscope (SEM) is one of the most versatile instruments available for the study and analysis of the morphology, topography, and chemical composition characterizations of numerous types of materials. When combined with the Energy dispersive X-ray spectroscopy (EDXS) also chemical composition is able to identify. Analysis of X-ray signals can be used to map the distribution of elements in the sample and estimate their abundance. Thanks to its adaptability, scanning electron microscope is suitable for a wide range of applications in science, research, industry and commerce. Samples can be organic, inorganic or composite materials. SEM can be used to visualise nanomaterials, fibres, coatings and films in the dry state. It is also extremely useful when coatings are applied to all types of materials.